
Students from the MSU College of Engineering and other academic institutions have the opportunity to study the effect of radiation on semiconductor devices and components during space electronics boot camps held on the MSU East Lansing campus. Through a collaboration with Texas Instruments (TI) and MSU's Facility for Rare Isotope Beams (FRIB), the students have a unique opportunity to work with a major manufacturer of space semiconductors and participate in actual testing at the FRIB.
Boot camps are designed for students entering their sophomore or junior year. Seniors are also welcome to apply.
Upcoming boot camps:
Contact Bill Harokopus at harokop1@msu.edu for registration details.
Contact Bill Harokopus at harokop1@msu.edu for registration details.


I am Dimash Aimurzayev, an Electrical Engineering Master's graduate from Michigan State University. During my time as a Research Assistant in the MAM Lab, led by Professor Sergey Baryshev, my thesis was focused on understanding the single-event latch-up (SEL) phenomena in analog-to-digital converters (ADCs). This work, in collaboration with Texas Instruments (TI) and MSU's Facility for Rare Isotope Beams (FRIB), utilized cutting-edge techniques such as relativistic heavy ion beam and UV-flash-light-photoemission microscopy to assess and mitigate the effects of SEL on ADC performance
Currently, I am a Test Engineer at Texas Instruments in the Mixed Signal Processors Department of the Embedded Processing Sector. My work includes developing test strategies for mixed signal processors, enhancing test efficiency, analyzing results for improvement, and reducing costs through optimized processes. I also collaborate with design, manufacturing, and cross-functional teams to ensure products transition smoothly from development to production. My career is dedicated to innovation and excellence in electrical engineering.

For more information, please contact Sergey Baryshev, serbar@msu.edu.